Mfg Part Number: 116475 | Manufacturer: Rugged Information Technology | NSN : 5962-01-449-0676 |
Item Name : microcircuit memory | CAGE Code : 09BZ2 | FSC : 5962 Microcircuits Electronic |
Thank you for your interest in NSN 5962-01-449-0676 manufactured by Rugged Information Technology. The particular NSN product you are looking for is listed alongside the part number 116475, and is described as Microcircuit Memory. As we have this item available, we invite you to request a quote for your comparisons by filling out our RFQ form below. Once you have completed our form, we ask that you provide us with details regarding target prices, quantities, and expected shipping time frame. In this way, we can provide you with a quote that meets your specifications and requirements.
Beyond NSN 5962-01-449-0676 manufactured under CAGE Code 09BZ2, and other various Rugged Information Technology parts, Acquire NSN has a stock inventory of over 2 billion new, used, obsolete, and hard-to-find NSN parts 116475 that work to meet the needs of a variety of industry verticals and applications. Acquire NSN operates under AS9120B and ISO 9001:2015 certification and FAA AC 00-56B accreditation to ensure the quality and authenticity of our offerings. We have developed an interface that simplifies the purchasing process with rapid response times for the industries we serve. Get started on the procurement process today and see why customers steadily rely on Acquire NSN for all their operational needs.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-449-0676 Item Description: Microcircuit Memory | 5962 | 014490676 | 0 | N | D | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | D | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
116475 | 5 | 2 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
CBBL | Features Provided | BIPOLAR AND BURN IN AND 3-STATE OUTPUT AND MONOLITHIC |
AEHX | Maximum Power Dissipation Rating | 1.04 WATTS |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CQSJ | Inclosure Material | CERAMIC |
MRC | Decoded Requirement | Clear Text Reply |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
TTQY | Terminal Type And Quantity | 24 PRINTED CIRCUIT |
CWSG | Terminal Surface Treatment | SOLDER |
AGAV | End Item Identification | TERMINAL, RADIO COMMUNICATIONS SETS (MILSTAR) AN/FRC-181 (V) AND AN/ARC-208 (V) |
CZEQ | Time Rating Per Chacteristic | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL INPUT |
CZER | Memory Device Type | PAL |
CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
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